Orientation Microscopy in the Transmission Electron Microscope - Investigations of Small Orientations Changes by Means of Orientation Mapping in TEM

نویسندگان

  • M. Bieda
  • K. Sztwiertnia
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

CORRELATION BETWEEN CRYSTAL ORIENTATION AND NANOGAP FORMED BY ELECTRO MIGRATION

Effect of electro migration on crystal structures of platinum nanowire (Nano bridge) during Nano-gap formation is investigated by means of Transmission Electron Microscopy (TEM). Selected area diffraction patterns as well as bright field images are used for this investigation. There were severely recessions in the polycrystalline Nano bridge and crystal structures around the nanogap changed ...

متن کامل

Towards 3D crystal orientation reconstruction using automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

To relate the internal structure of a volume (crystallite and phase boundaries) to properties (electrical, magnetic, mechanical, thermal), a full 3D reconstruction in combination with in situ testing is desirable. In situ testing allows the crystallographic changes in a material to be followed by tracking and comparing the individual crystals and phases. Standard transmission electron microscop...

متن کامل

Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps.

Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backsca...

متن کامل

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

Transmission electron backscattered diffraction, t-EBSD, in the scanning electron microscope, SEM, was initially described in 2010 [1]. After slow initial acceptance, the number of publications in which it is used is increasing markedly. Many of the first applications took advantage of the higher resolution of t-EBSD in the study of thin films [2], [3]. More recently it is being used for pre-sc...

متن کامل

Angle Resolved TEM Imaging of Pt Nanoparticles

Particle shape and size are two of the most important characteristics of nanoparticulate catalysts that determined their activity and selectivity. In many studies, the shapes of nanoparticles are characterized using transmission electron micrographs obtained at a single nanoparticle orientation and thus, the shape determination is based on viewing a single cross-sectional profile of the nanopar...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2017